*Four
side planes of the carrier are continuously measured
by rotating the kinematic plate in 90? increments
*SEMI-compliant kinematic plate provides perfect
XYZ coordinates
*Variety of illumination choices facilitate accurate
measurements of registration pin holes and latch-key
holes
* Laser AF provides
fast, non-contact measurements of wafer positions
*W ide area, high-intensity LED illumination enables
accurate measurements of wafer heights 300mm, 200mm
wafer carrier and SMIF Pod door
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