NEXIV VMR
NEXIV VMR-3020-Standard Type
The standard model of the NEXIV series. It handles a variety of measurement tasks including those for mechanical parts, molded parts, stamped parts and various other workpieces.
*Available in three types with different magnification ranges
* Variety of illumination choices facilitate accurate detection of edges in molded parts
* Long working distance (50mm) permits measurements of parts with big height gaps
* 15X zoom provides universal applications while facilitating easy search at low magnifications and accurate measurements at high magnifications
* User-friendly software
* Laser AF facilitates evaluations of cross-sectional shapes and 3D profiling as well as the flatness of workpiece surfaces
* Versatile functions and user-friendly operation

Applications
Semiconductor packages
Substrates
Stamped parts
Connectors
Injection molded parts

NEXIV VMR-3020 Z120X-Standard Type with Maximum Magnification Module
Its maximum magnification module achieves measurements of fine workpieces. Perfect for measurements of typical MEMS parts, high-density PCBs and semiconductor packages.
*Maximum magnification module and high-precision stage enable accurate measurements of large geometry workpieces and minute shapes
* Laser AF with minute laser spots provides accurate measurements of small cross-sectional shapes
* Optional surface analysis software displays 3D shapes of MEMS parts

Applications
High-density PCBs
Exposure masks for substrates
Packages (2D + height)
MEMS parts

<
NEXIV VMR-H3030-Ultrahigh-precision Type
With ultrahigh precision and versatility, this model can serve as the master instrument in your laboratory. Ideal for high-precision dies and molds.
*Ultrahigh precision appropriate for the master instrument
* Wide illumination choices ensure accurate detection of edges in dies and molds
* Long working distance (50mm) permits measurements of parts with big height gaps
* 15X zoom provides universal applications while facilitating easy search at low magnifications and accurate measurements at high magnifications
* User-friendly software

Applications
Master instrument in a laboratory
Dies and molds
Finely machined parts

NEXIV VMR-H3030 Z120X-Ultrahigh-precision Type with Maximum Magnification Module
With an ultrahigh-precision stage and maximum magnification module, it measures fine workpieces with ultrahigh accuracy (e.g., critical dimensions on patterned masks and bump heights).

*120X optical magnification enables measurements of rerouted patterns on wafer level CSP
* High precision stage facilitates accurate measurements even for wider dimensions
* Enables measurements of top and bottom widths of etched lines, respectively
* Laser AF facilitates measurements of minuscule bump heights
* Enables evaluation of cross-sectional shapes of bumps and solder balls

Applications
Wafer level CSP
Wafer level bump heights
Wafer level SIP
Rerouted masks
Masks for MEMS

NEXIV VMR-6555-Large Stroke Type
High-speed measurements with a large stroke stage. Optimal for measurements of PCB patterns and external dimensions of a display panel. You can save inspection costs by measuring a number of small parts at one time after placing them together on the stage.

*650 x 550 mm stage stroke perfect for PCBs
* Automatic measurements of small parts by placing multiple pieces together on the stage
* Laser AF achieves high-accuracy measurements of bump heights
* Laser AF also enables measurements of height gaps and warping in workpieces
* Search function enables measurements of lands and holes of PCBs
* Search function also provides accurate measurements even when workpieces are not located properly on the stage
*
Variety of illumination choices facilitate accurate edge detection even for vague geometries
* High-speed stage and high-speed image processing provide high throughput

Applications
Semiconductor packages (multiple pieces)
Substrates
Printing masks for substrates
Stamped parts (multiple pieces)
Connectors (multiple pieces)
Injection molded parts (multiple pieces)

NEXIV VMR-6555 Z120X-Large Stroke Type with Maximum Magnification Module
Amazing 120X zoom combined with a big stage enables ultrahigh magnification measurements on big workpieces. Ideal for measuring high-density PCBs and their masks.
*Amazing 120X zoom
* Enables measurements of 1?m linewidths at the maximum magnification
* Laser AF perfect for measuring minuscule, complicated geometries
* High-speed stage and high-speed image processing provide high throughput

Applications
High-density PCBs
Exposure masks for substrates
Semiconductor packages (multiple pieces; 2D + height)
Photo plotter machines for masks

NEXIV VMR-10080-Ultra-large Stroke Type
ALong 1000 x 800 mm stage stroke provides maximum performance in the measurement of large-size workpieces such as FPD devices.
*Long stage stroke enables measurements of LCD substrates/modules and large-size PCBs
* Laser AF also enables measurements of height gaps and warping in workpieces
* Search function enables measurements of lands and holes of PCBs
* Variety of illumination choices facilitate accurate edge detection even for vague geometries
* High-speed stage and high-speed image processing provide high throughput

Applications
Printing masks for substrates
Mother substrates for PCBs
Shadow masks
FPD devices
NEXIV VMR-10080 Z120X-Ultra-large Stroke Type with Maximum Magnification Module
The model achieves ultrahigh magnification measurements with a long 1000 x 800 mm stage stroke. Ideal for measuring minute linewidths of large-size display panels.
*Automatic measurements of small parts by placing multiple pieces together on the stage
* Laser AF achieves high-accuracy measurements of bump heights
* Laser AF also enables measurements of height gaps and warping in workpieces
* Search function enables measurements of lands and holes of PCBs
* Search function also provides accurate measurements even when workpieces are not located properly on the stage
* Variety of illumination choices facilitate accurate edge detection even for vague geometries
* High-speed stage and high-speed image processing provide high throughput

Applications
LCD glass substrates (pattern measurements)
Organic EL glass substrates (pattern measurements)